An apparatus, system, and method are disclosed for migrating wear spots in solid-state drives. A count module counts lifetime write cycles for logical units of a plurality of solid-state memories. Each logical unit has a logical address. An identification module identifies a wear spot on a first logical unit of a first solid-state memory if a count for the first logical unit exceeds a cycle threshold. A migration module dynamically migrates data of the first logical unit to a second solid-state memory, wherein the data is continuously available at an original logical address.