发明授权
US08058100B2 Method for fabricating chip scale package structure with metal pads exposed from an encapsulant
有权
用于制造具有从密封剂暴露的金属焊盘的芯片级封装结构的方法
- 专利标题: Method for fabricating chip scale package structure with metal pads exposed from an encapsulant
- 专利标题(中): 用于制造具有从密封剂暴露的金属焊盘的芯片级封装结构的方法
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申请号: US12788772申请日: 2010-05-27
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公开(公告)号: US08058100B2公开(公告)日: 2011-11-15
- 发明人: Han-Ping Pu , Chien-Ping Huang , Cheng-Hsu Hsiao
- 申请人: Han-Ping Pu , Chien-Ping Huang , Cheng-Hsu Hsiao
- 申请人地址: TW Taichung
- 专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人地址: TW Taichung
- 代理机构: Edwards Wildman Palmer LLP
- 代理商 Peter F. Corless; Steven M. Jensen
- 优先权: TW95146383A 20061212
- 主分类号: H01L21/60
- IPC分类号: H01L21/60
摘要:
A chip scale package structure and a method for fabricating the same are disclosed. The method includes forming metal pads on a predetermined part of a carrier; mounting chips on the carrier, each of the chips having a plurality of conductive bumps soldered to the metal pads; forming an encapsulant on the carrier to encapsulate the chips and the conductive bumps; removing the carrier to expose the metal pads and even the metal pads with a surface of the encapsulant; forming on the encapsulant a plurality of first conductive traces electrically connected to the metal pads; applying a solder mask on the first conductive traces, and forming a plurality of openings on the solder mask to expose a predetermined part of the first conductive traces; forming a plurality of conductive elements on the predetermined part; and cutting the encapsulant to form a plurality of chip scale package structures.
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