Invention Grant
- Patent Title: Method and apparatus for contactless determination of a lateral offset relative to a straight-ahead direction
- Patent Title (中): 用于非接触地确定相对于直前方向的横向偏移的方法和装置
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Application No.: US12540989Application Date: 2009-08-13
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Publication No.: US08064047B2Publication Date: 2011-11-22
- Inventor: Lukas Puellen , Dietmar Kaul , Michael Doerr
- Applicant: Lukas Puellen , Dietmar Kaul , Michael Doerr
- Applicant Address: CH Winterthur
- Assignee: Kistler Holding AG
- Current Assignee: Kistler Holding AG
- Current Assignee Address: CH Winterthur
- Agency: Crowell & Moring LLP
- Priority: DE102007008002 20070215
- Main IPC: G01P3/36
- IPC: G01P3/36

Abstract:
Method and apparatus for contactless determination of lateral offset relative to a straight-ahead direction when an object moves relative to an object with a stochastic surface structure, in which the surface structure is imaged on at least two similar photosensors arranged behind one another at a defined separation in the straight-ahead direction and having a spatially resolving longitudinal extent transverse to the straight-ahead direction, a spatial frequency signal corresponding to the surface structure is generated by the sensors, the spatial frequency signal of a second sensor in the movement direction is read, temporally shifted relative to the spatial frequency signal of the first sensor, such that the same, at least partially overlapping surface structure is imaged on both sensors, the spatial frequency signals of the first and second sensors are correlated to determine a correlation coefficient, and the lateral offset of the correlated spatial frequency signals on the sensors is determined.
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Information query
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