发明授权
- 专利标题: Differential interference phase contrast X-ray imaging system
- 专利标题(中): 差分干涉相位对比X射线成像系统
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申请号: US12426991申请日: 2009-04-21
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公开(公告)号: US08073099B2公开(公告)日: 2011-12-06
- 发明人: Han-Ben Niu , Jin-Chuan Guo , Xin Liu
- 申请人: Han-Ben Niu , Jin-Chuan Guo , Xin Liu
- 申请人地址: CN Shenzhen, Guangdong
- 专利权人: Shenzhen University
- 当前专利权人: Shenzhen University
- 当前专利权人地址: CN Shenzhen, Guangdong
- 代理机构: Harris Shelton Hanover Walsh
- 优先权: CN200810216469 20081010
- 主分类号: G01N23/083
- IPC分类号: G01N23/083
摘要:
A differential phase-contrast X-ray imaging system is provided. Along the direction of X-ray propagation, the basic components are X-ray tube, filter, object platform, X-ray phase grating, and X-ray detector. The system provides: 1) X-ray beam from parallel-arranged source array with good coherence, high energy, and wider angles of divergence with 30-50 degree. 2) The novel X-ray detector adopted in present invention plays dual roles of conventional analyzer grating and conventional detector. The basic structure of the detector includes a set of parallel-arranged linear array X-ray scintillator screens, optical coupling system, an area array detector or parallel-arranged linear array X-ray photoconductive detector. In this case, relative parameters for scintillator screens or photoconductive detector correspond to phase grating and parallel-arranged line source array, which can provide the coherent X-rays with high energy.
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