发明授权
- 专利标题: Methods and systems for detecting a narrow-band interferer
- 专利标题(中): 用于检测窄带干扰源的方法和系统
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申请号: US12099002申请日: 2008-04-07
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公开(公告)号: US08077786B2公开(公告)日: 2011-12-13
- 发明人: Dumitru Mihai Ionescu , Abu Amanullah , Ghobad Heidari-Bateni
- 申请人: Dumitru Mihai Ionescu , Abu Amanullah , Ghobad Heidari-Bateni
- 申请人地址: JP Hachioji-Shi, Tokyo
- 专利权人: Olympus Corporation
- 当前专利权人: Olympus Corporation
- 当前专利权人地址: JP Hachioji-Shi, Tokyo
- 代理机构: Sheppard Mullin Richter & Hampton LLP
- 主分类号: H04K1/10
- IPC分类号: H04K1/10 ; H04L27/28
摘要:
Various embodiments of the systems and methods described herein may be used to compute a minimum variance unbiased estimator by receiving a first OFDM signal at a pilot tone, receiving a second OFDM signal sent in the same frequency band and determining a differential phase metric between the first OFDM signal and the second OFDM signal. In some embodiments, the differential phase metric may be used to diversity combine synchronization statistics. In various embodiments, the differential phase metric may be used to detect a narrow-band interference.
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