发明授权
- 专利标题: Delay measuring device and semiconductor device
- 专利标题(中): 延时测量装置及半导体装置
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申请号: US12127369申请日: 2008-05-27
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公开(公告)号: US08078950B2公开(公告)日: 2011-12-13
- 发明人: Makoto Kawamura
- 申请人: Makoto Kawamura
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2007-151388 20070607
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
A delay measuring device according to the present invention comprises a memory cell, a delay element and a selector. The memory cell is provided with a non-inversion output terminal and an inversion output terminal, and the memory cell fetches a data value inputted from outside in synchronization with a clock, retains the fetched data value and outputs the retained data value from the non-inversion output terminal and the inversion output terminal. The delay element is connected to the inversion output terminal. The selector selects one of the data value and a delayed data value outputted from the delay element and supplies the selected data value to the memory cell. In the present invention, a comparison result of making a comparison between a delay amount generated in the delayed data value and a time length defined based on the clock is outputted from the non-inversion output terminal.
公开/授权文献
- US20080303544A1 DELAY MEASURING DEVICE AND SEMICONDUCTOR DEVICE 公开/授权日:2008-12-11
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