发明授权
US08080875B2 Interconnection substrate and semiconductor device, manufacturing method of interconnection substrate 有权
互连基板和半导体器件,互连基板的制造方法

  • 专利标题: Interconnection substrate and semiconductor device, manufacturing method of interconnection substrate
  • 专利标题(中): 互连基板和半导体器件,互连基板的制造方法
  • 申请号: US11968341
    申请日: 2008-01-02
  • 公开(公告)号: US08080875B2
    公开(公告)日: 2011-12-20
  • 发明人: Yoshihiko Imanaka
  • 申请人: Yoshihiko Imanaka
  • 申请人地址: JP Kawasaki
  • 专利权人: Fujitsu Limited
  • 当前专利权人: Fujitsu Limited
  • 当前专利权人地址: JP Kawasaki
  • 优先权: JP2007-038199 20070219
  • 主分类号: H01L23/48
  • IPC分类号: H01L23/48
Interconnection substrate and semiconductor device, manufacturing method of interconnection substrate
摘要:
An interconnection substrate including therein one or more resin layers, each of the resin layers including therein a via-hole penetrating from a top surface to a bottom surface of the resin layer. A via-plug of metal particles is formed in the via-hole. Each of the metal particles has a flattened shape generally parallel to a plane of the resin layer.
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