发明授权
- 专利标题: High spatial resolution imaging of a structure of interest in a specimen
- 专利标题(中): 样本中感兴趣结构的高空间分辨率成像
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申请号: US13013359申请日: 2011-01-25
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公开(公告)号: US08084754B2公开(公告)日: 2011-12-27
- 发明人: Stefan Hell , Christian Eggeling , Alexander Egner , Jonas Fölling , Andreas Schönle , Mariano Bossi
- 申请人: Stefan Hell , Christian Eggeling , Alexander Egner , Jonas Fölling , Andreas Schönle , Mariano Bossi
- 申请人地址: DE München
- 专利权人: Max-Planck-Gesellschaft zur Förderung der Wissenschaften E.V.
- 当前专利权人: Max-Planck-Gesellschaft zur Förderung der Wissenschaften E.V.
- 当前专利权人地址: DE München
- 代理机构: Thomas, Kayden, Horstemeyer & Risley, LLP
- 优先权: DE102006021317 20060506
- 主分类号: G01N21/64
- IPC分类号: G01N21/64
摘要:
For imaging of a structure, the structure is marked with a substance which can be converted by a switching signal from a first into a second state, and which provides an optical measurement signal in one of its states, only. The switching signal is applied such that at least 10% of the molecules of the substance being in the measurement signal providing state are at a distance from their closest neighbors, which is greater than the spatial resolution limit of imaging the specimen onto a sensor array, which in turn is greater than an average distance between the molecules of the substance. From an intensity distribution of the measurement signal recorded with the sensor array, the position is only determined for those molecules of the substance which are at a distance from their closest neighboring molecules in the measurement signal providing state, which is greater than the spatial resolution limit.
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