Invention Grant
US08086041B2 Pattern evaluation method, pattern matching method and computer readable medium
失效
模式评估方法,模式匹配方法和计算机可读介质
- Patent Title: Pattern evaluation method, pattern matching method and computer readable medium
- Patent Title (中): 模式评估方法,模式匹配方法和计算机可读介质
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Application No.: US12659294Application Date: 2010-03-03
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Publication No.: US08086041B2Publication Date: 2011-12-27
- Inventor: Tadashi Mitsui
- Applicant: Tadashi Mitsui
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2005-098513 20050330; JP2005-099052 20050330
- Main IPC: G06K9/48
- IPC: G06K9/48

Abstract:
A pattern evaluation method includes: generating first array data from edge data on a pattern to be evaluated, the edge data on the pattern to be evaluated being shape data including edge points of the pattern to be evaluated; generating second array data from edge data on a reference pattern, the edge data on the reference pattern including edge points of the reference pattern which serves as an inspection standard of the pattern to be evaluated; subjecting each component of the second array data to array conversion processing, the array conversion processing being designed to convert a value of the component of the second array data into a function value of a value of a distance from that component to the edge point closest thereto, thereby generating third array data; executing arithmetic processing between the first array data and the third array data to generate fourth array data; and using a component of the fourth array data to calculate a numerical value representative of an relation between the pattern to be evaluated and the reference pattern.
Public/Granted literature
- US20100158389A1 Pattern evaluation method, pattern matching method and computer readable medium Public/Granted day:2010-06-24
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