发明授权
US08086310B2 Power supply monitoring for an implantable device 有权
可植入设备的电源监控

Power supply monitoring for an implantable device
摘要:
A method and an apparatus for projecting an end of service (EOS) and/or an elective replacement indication (ERI) of a component in an implantable device and for determining an impedance experienced by a lead associated with the implantable device. An active charge depletion of an implantable device is determined. An inactive charge depletion of the implantable device is determined. A time period until an end of service (EOS) and/or elective replacement indication (ERI) of a power supply associated with the IMD based upon the active charge depletion, the inactive charge depletion, and the initial and final (EOS) battery charges, is determined. Furthermore, to determine the impedance described above, a substantially constant current signal is provided through a first terminal and a second terminal of the lead. A voltage across the first and second terminals is measured. An impedance across the first and second terminals is determined based upon the constant current signal and the measured voltage.
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