发明授权
- 专利标题: On-chip measurement of signals
- 专利标题(中): 片上信号测量
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申请号: US12489525申请日: 2009-06-23
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公开(公告)号: US08089296B2公开(公告)日: 2012-01-03
- 发明人: Kanak Behari Agarwal , Jerry D. Hayes
- 申请人: Kanak Behari Agarwal , Jerry D. Hayes
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Garg Law Firm, PLLC
- 代理商 Rakesh Garg; Libby Z. Toub
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
A method, system, and computer usable program product for in an integrated circuit are provided in the illustrative embodiments. A signal to be measured is identified in the IC. The signal is provided as a first control voltage input to a first VCO in the IC. A first output frequency is generated from the first VCO, the first output frequency having a first frequency value corresponding to the signal. The signal is provided as a second control voltage input to a second VCO in the IC. A second output frequency is generated from the second VCO, the second output frequency having a second frequency value corresponding to the signal. The first and the second output frequency values are exported from the IC. A mean value and a standard deviation of the signal are computed using the output first and second frequency values.
公开/授权文献
- US20100321050A1 ON-CHIP MEASUREMENT OF SIGNALS 公开/授权日:2010-12-23
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