Invention Grant
- Patent Title: Control and monitoring system for thin die detachment and pick-up
- Patent Title (中): 用于薄型脱模和拾取的控制和监控系统
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Application No.: US12701065Application Date: 2010-02-05
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Publication No.: US08092645B2Publication Date: 2012-01-10
- Inventor: Siu Ping Yip , Chi Ming Chong , Man Wai Chan , Kwok Wai Wong
- Applicant: Siu Ping Yip , Chi Ming Chong , Man Wai Chan , Kwok Wai Wong
- Applicant Address: HK Hong Kong
- Assignee: ASM Assembly Automation Ltd
- Current Assignee: ASM Assembly Automation Ltd
- Current Assignee Address: HK Hong Kong
- Agency: Ostrolenk Faber LLP
- Main IPC: B32B38/10
- IPC: B32B38/10

Abstract:
During detachment of a die from an adhesive tape, the inner and outer portions of a first side of the die which is in contact with the adhesive tape is supported with a support surface. A collet contacts the inner and outer portions of a second side of the die opposite to the first side. Support is withdrawn from the outer portion of the die such that the outer portion of the second side of the die bends away from the collet while the support surface only supports the inner portion of the die. Vacuum suction from the collet is applied to attract the outer portion of the die towards the collet and the vacuum suction pressure is monitored until a threshold pressure is reached indicating that the outer portion of the die is contacting the collet. Thereafter, the collet is lifted while holding the die with vacuum suction to completely separate the die from the adhesive tape.
Public/Granted literature
- US20110192547A1 CONTROL AND MONITORING SYSTEM FOR THIN DIE DETACHMENT AND PICK-UP Public/Granted day:2011-08-11
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