Invention Grant
- Patent Title: Ion current measurement device
- Patent Title (中): 离子电流测量装置
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Application No.: US12246982Application Date: 2008-10-07
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Publication No.: US08093883B2Publication Date: 2012-01-10
- Inventor: Jui-Fang Chen , Cheng-Hung Chang , Chung-Jung Chen , Chien-Kuo Ko , Chi-Chun Yao
- Applicant: Jui-Fang Chen , Cheng-Hung Chang , Chung-Jung Chen , Chien-Kuo Ko , Chi-Chun Yao
- Applicant Address: TW Science-Based Industrial Park, Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsinchu
- Agent Winston Hsu; Scott Margo
- Main IPC: G01N27/00
- IPC: G01N27/00

Abstract:
The invention provides an ion current measurement device for a tool having an ion source. The ion current measurement device comprises an ion collecting cup and a replaceable liner. The ion collecting cup is disposed in the tool and the ion collecting cup possesses a cup opening facing the ion source. The replaceable liner is disposed in the ion collecting cup and the replaceable liner entirely covers a continuous inner sidewall of the ion collecting cup.
Public/Granted literature
- US20100085033A1 ION CURRENT MEASUREMENT DEVICE Public/Granted day:2010-04-08
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