发明授权
US08099299B2 System and method for mapping structural and functional deviations in an anatomical region
有权
用于在解剖学区域映射结构和功能偏差的系统和方法
- 专利标题: System and method for mapping structural and functional deviations in an anatomical region
- 专利标题(中): 用于在解剖学区域映射结构和功能偏差的系统和方法
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申请号: US12123824申请日: 2008-05-20
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公开(公告)号: US08099299B2公开(公告)日: 2012-01-17
- 发明人: Saad Ahmed Sirohey , Gopal B. Avinash , Fausto J. Espinal , Zhongmin Lin , Ananth Mohan
- 申请人: Saad Ahmed Sirohey , Gopal B. Avinash , Fausto J. Espinal , Zhongmin Lin , Ananth Mohan
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 代理机构: Fletcher Yoder, P.C.
- 主分类号: G06Q10/00
- IPC分类号: G06Q10/00 ; A61B5/05 ; G06K9/00 ; H04N15/00
摘要:
A data processing technique is provided. In one embodiment, a computer-implemented method includes accessing individual patient deviation maps indicative of a structural difference and a functional difference, respectively, of at least one anatomical region of a patient with respect to standardized reference image data. The method may also include generating a composite patient deviation map indicative of both the structural difference and the functional difference based on at least the individual patient deviation maps, and outputting the composite patient deviation map. Additional methods, systems, and manufactures are also disclosed.
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