发明授权
- 专利标题: Voltage measurement in an imaging system
- 专利标题(中): 成像系统中的电压测量
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申请号: US12603261申请日: 2009-10-21
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公开(公告)号: US08100584B2公开(公告)日: 2012-01-24
- 发明人: Ariel Friedlander , Jonathan Richard Schmidt , Thomas Louis Toth
- 申请人: Ariel Friedlander , Jonathan Richard Schmidt , Thomas Louis Toth
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 代理机构: Fletcher Yoder
- 主分类号: G01D18/00
- IPC分类号: G01D18/00
摘要:
Methods and systems are generally described for measuring a voltage used by an imaging system to generate radiation used in imaging. In embodiments, different datasets are acquired using different degrees of attenuation of the radiation. The differently attenuated datasets are processed to derive a ratio of the differential attenuation. The attenuation ratio is processed to derive a measure of the voltage used by the imaging system to generate the radiation used to acquire the different datasets.
公开/授权文献
- US20110091017A1 VOLTAGE MEASUREMENT IN AN IMAGING SYSTEM 公开/授权日:2011-04-21
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