发明授权
- 专利标题: Surface contamination examining device and method
- 专利标题(中): 表面污染检查装置及方法
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申请号: US12438816申请日: 2007-03-30
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公开(公告)号: US08106362B2公开(公告)日: 2012-01-31
- 发明人: Yoshiyuki Shirakawa
- 申请人: Yoshiyuki Shirakawa
- 申请人地址: JP Chiba
- 专利权人: National Institute of Radiological Sciences
- 当前专利权人: National Institute of Radiological Sciences
- 当前专利权人地址: JP Chiba
- 代理机构: Griffin & Szipl, P.C.
- 优先权: JP2006-282182 20061017
- 国际申请: PCT/JP2007/057184 WO 20070330
- 国际公布: WO2008/047487 WO 20080424
- 主分类号: G01T1/24
- IPC分类号: G01T1/24
摘要:
A surface contamination examining device includes a radiation detector 11 and an arithmetic/display device 13 for displaying radiation intensity in form of a counting rate. The arithmetic/display device has a boundary detecting device 10 that detects the boundary of contamination 14 of an object to be measured by a radioactive material while the radiation detector moves along a surface 18 of the object to be measured. The boundary detecting device 10 includes a counting rate storage unit that sequentially stores counting rates Yi at a predetermined time interval, a slope arithmetic unit that computes slopes aM and aN of approximation lines from previous M (where M is an integer of 3 or larger) counting rates Yi including a final counting rate YM and previous N (where N is an integer smaller than M) counting rates Yi including the final counting rate YM, and a boundary determining unit that determines the boundary of contamination of the object to be measured by the radioactive material on the basis of lines of slope aM and aN.
公开/授权文献
- US20090294669A1 SURFACE CONTAMINATION EXAMINING DEVICE AND METHOD 公开/授权日:2009-12-03
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