Invention Grant
- Patent Title: Methods and apparatus for built in self test of analog-to-digital convertors
- Patent Title (中): 模拟数字转换器内置自检的方法和装置
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Application No.: US12697435Application Date: 2010-02-01
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Publication No.: US08106801B2Publication Date: 2012-01-31
- Inventor: Sachin D Dasnurkar
- Applicant: Sachin D Dasnurkar
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM, Incorporated
- Current Assignee: QUALCOMM, Incorporated
- Current Assignee Address: US CA San Diego
- Agent William M. Hooks
- Main IPC: H03M1/10
- IPC: H03M1/10
Abstract:
An apparatus configured for built in self test (BiST) of analog-to-digital convertors (ADCs) is described. The apparatus includes an ADC to be tested. The apparatus includes a ramp generator. The ramp generator provides a voltage ramp to the ADC. The apparatus further includes feedback circuitry for the ramp generator. The feedback circuitry maintains a constant ramp slope for the ramp generator. The apparatus includes an interval counter. The interval counter provides a timing reference.
Public/Granted literature
- US20100253559A1 METHODS AND APPARATUS FOR BUILT IN SELF TEST OF ANALOG-TO-DIGITAL CONVERTORS Public/Granted day:2010-10-07
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