Invention Grant
- Patent Title: Circuitry testing method and circuitry testing device
- Patent Title (中): 电路测试方法和电路测试装置
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Application No.: US11821729Application Date: 2007-06-25
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Publication No.: US08106946B2Publication Date: 2012-01-31
- Inventor: Shuo-Ting Yan
- Applicant: Shuo-Ting Yan
- Applicant Address: TW Miao-Li County
- Assignee: Chimei Innolux Corporation
- Current Assignee: Chimei Innolux Corporation
- Current Assignee Address: TW Miao-Li County
- Agency: Altis Law Group, Inc.
- Priority: TW95122734A 20060623
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
A circuitry testing method, comprising: providing a circuit board needing testing; applying a potential (160) to the circuit board needing testing so that the circuit board works and operating elements of the circuit board needing testing emit infrared rays; testing an intensity of radiation of the infrared rays using an infrared sensor (110); converting the radiation intensity to RGB (red, green, blue) data signals in order to form a diagnostic infrared image, using a processor (130); providing a standard infrared image; comparing the diagnostic infrared image with the standard infrared image; and determining whether the circuit board is defective according to the comparison.
Public/Granted literature
- US20080094469A1 Circuitry testing method and circuitry testing device Public/Granted day:2008-04-24
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