发明授权
- 专利标题: Substrate conveyance device and substrate conveyance method, exposure apparatus and exposure method, device manufacturing method
- 专利标题(中): 基板输送装置及基板输送方法,曝光装置及曝光方法,装置的制造方法
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申请号: US11889288申请日: 2007-08-10
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公开(公告)号: US08107055B2公开(公告)日: 2012-01-31
- 发明人: Atsushi Ohta , Takashi Horiuchi
- 申请人: Atsushi Ohta , Takashi Horiuchi
- 申请人地址: JP Katta-gun JP Tokyo
- 专利权人: Zao Nikon Co., LTD.,Nikon Corporation
- 当前专利权人: Zao Nikon Co., LTD.,Nikon Corporation
- 当前专利权人地址: JP Katta-gun JP Tokyo
- 代理机构: Oliff & Berridge, PLC
- 优先权: JP2003-349550 20031008
- 主分类号: G03B27/32
- IPC分类号: G03B27/32
摘要:
A method of pattern forming includes forming a resist film on a substrate, transferring a pattern onto the resist film by an immersion lithography method using a liquid immersion fluid to form a latent image on the resist film, conducting a first inspection to inspect whether or not the liquid immersion fluid remains on the resist film after said forming the latent image, developing the resist film after the first inspection, and performing predetermined processing when residual of the liquid immersion fluid is found in the first inspection.
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