Invention Grant
- Patent Title: Non-volatile semiconductor memory device in which program disturb is reduced and method of programming the same
- Patent Title (中): 减少程序干扰的非易失性半导体存储器件及其编程方法
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Application No.: US12662431Application Date: 2010-04-16
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Publication No.: US08111553B2Publication Date: 2012-02-07
- Inventor: Bo-Young Seo , Hee-Seog Jeon , Kwang-Tae Kim , Ji-Hoon Park , Myung-Jo Chun
- Applicant: Bo-Young Seo , Hee-Seog Jeon , Kwang-Tae Kim , Ji-Hoon Park , Myung-Jo Chun
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2009-0034273 20090420
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/06

Abstract:
A non-volatile semiconductor memory device capable of reducing program disturb and a method of programming the same are provided. A bit line connected to a non-selected memory cell in the same block as a selected memory cell enters a floating state by inactivating a bit line selection switch, so that voltage levels of an first conductivity type channel and a source/drain terminal formed in a pocket second conductivity type well below a memory transistor have an intermediate level of a voltage level of a selection line and the pocket P type well. Therefore, program disturb caused by FN tunneling and junction hot electrons can be inhibited.
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