Invention Grant
US08116117B2 Method of driving multi-level variable resistive memory device and multi-level variable resistive memory device
有权
驱动多级可变电阻式存储器件和多级可变电阻式存储器件的方法
- Patent Title: Method of driving multi-level variable resistive memory device and multi-level variable resistive memory device
- Patent Title (中): 驱动多级可变电阻式存储器件和多级可变电阻式存储器件的方法
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Application No.: US12632018Application Date: 2009-12-07
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Publication No.: US08116117B2Publication Date: 2012-02-14
- Inventor: Woo-Yeong Cho , Ki-Sung Kim , Du-Eung Kim , Kwang-Jin Lee , Jun-Soo Bae
- Applicant: Woo-Yeong Cho , Ki-Sung Kim , Du-Eung Kim , Kwang-Jin Lee , Jun-Soo Bae
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2006-0119148 20061129
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
Disclosed is a method of driving a multi-level variable resistive memory device. A method of driving a multi-level variable resistive memory device includes supplying a write current to a variable resistive memory cell so as to change resistance of the variable resistive memory cell, verifying whether or not changed resistance enters a predetermined resistance window, the intended resistance window depending on the resistance of reference cells, and supplying a write current having an increased or decreased amount from the write current supplied most recently on the basis of the verification result so as to change resistance of the variable resistive memory cell.
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