Invention Grant
- Patent Title: Vision inspection system and method for inspecting workpiece using the same
- Patent Title (中): 视觉检查系统及使用其检查工件的方法
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Application No.: US12266437Application Date: 2008-11-06
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Publication No.: US08116555B2Publication Date: 2012-02-14
- Inventor: Woo Jung Ahn , Jung Hwan Kim , Hee Wook You
- Applicant: Woo Jung Ahn , Jung Hwan Kim , Hee Wook You
- Applicant Address: KR Seoul
- Assignee: SNU Precision Co., Ltd.
- Current Assignee: SNU Precision Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: KR10-2007-0030469 20070328
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A vision inspection system and a workpiece inspection method are used in inspecting a workpiece. The vision inspection system includes a level block having an upper surface whose opposite end regions are defined as a first position and a second position. A first transfer device has a table for supporting the workpiece. The first transfer device is installed on the upper surface of the level block for rectilinearly moving the table between the first position and the second position. A camera is arranged above the level block for taking an image of the workpiece to output image data. A second transfer device is installed on the upper surface of the level block for rectilinearly moving the camera between the first position and the second position. A computer is connected to the first transfer means, the camera and the second transfer means to control them in a specified manner.
Public/Granted literature
- US20090087080A1 VISION INSPECTION SYSTEM AND METHOD FOR INSPECTING WORKPIECE USING THE SAME Public/Granted day:2009-04-02
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