发明授权
US08117018B2 Determining structural dip and azimuth from LWD resistivity measurements in anisotropic formations
有权
确定各向异性地层中LWD电阻率测量的结构倾角和方位角
- 专利标题： Determining structural dip and azimuth from LWD resistivity measurements in anisotropic formations
- 专利标题（中）： 确定各向异性地层中LWD电阻率测量的结构倾角和方位角
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申请号： US12356430申请日： 2009-01-20
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公开(公告)号： US08117018B2公开(公告)日： 2012-02-14
- 发明人: Sheng Fang , Gulamabbas Merchant , Eric Hart , Andrew D. Kirkwood , Tsili Wang
- 申请人： Sheng Fang , Gulamabbas Merchant , Eric Hart , Andrew D. Kirkwood , Tsili Wang
- 申请人地址： US TX Houston
- 专利权人： Baker Hughes Incorporated
- 当前专利权人： Baker Hughes Incorporated
- 当前专利权人地址： US TX Houston
- 代理机构： Mossman Kumar & Tyler PC
- 主分类号： G01V3/38
- IPC分类号： G01V3/38 ; G01V1/48
摘要：
Cross-component measurements in combination with standard propagation resistivity measurements are processed to estimate the vertical and horizontal resistivities, relative dip and relative azimuth of an anisotropic earth formation.
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