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US08120155B2 Reduced stiction and mechanical memory in MEMS devices 有权
降低MEMS器件的静态和机械记忆

Reduced stiction and mechanical memory in MEMS devices
Abstract:
A MEMS device is packaged in a process which hydrogen (H) deuterium (D) for reduced stiction. H is exchanged with D by exposing the MEMS device with a deuterium source, such as deuterium gas or heavy water vapor, optionally with the assistance of a direct or downstream plasma.
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