发明授权
- 专利标题： Temperature sensor probe and manufacturing method of the same
- 专利标题（中）： 温度传感器探头及其制造方法相同
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申请号： US12269553申请日： 2008-11-12
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公开(公告)号： US08123403B2公开(公告)日： 2012-02-28
- 发明人: Shunji Ichida , Seiichiro Kinugasa , Atsushi Kato
- 申请人： Shunji Ichida , Seiichiro Kinugasa , Atsushi Kato
- 申请人地址： JP Tokyo
- 专利权人： Yamatake Corporation
- 当前专利权人： Yamatake Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： McDermott Will & Emery LLP
- 优先权： JP2007-302586 20071122
- 主分类号： G01K11/00
- IPC分类号： G01K11/00 ; G01J5/00
摘要：
To provide a temperature sensor probe that can conduct stable measurements, and the manufacturing method of the same. The temperature sensor probe related to the present invention provides: a fluorescent material that is a mixture of a fluorescent substance and a transparent material; a thermosensitive part having a concave part in which the fluorescent material is arranged; a waveguide route rod that propagates excitation light, which is irradiated on the fluorescent material, and fluorescent light, which is produced by the fluorescent substance; and a protective tube that covers the side surfaces of the waveguide route rod. Then, the fluorescent material is affixed to the tip of the waveguide route rod using the transparent material, and the waveguide route rod bites into the fluorescent material.
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