发明授权
US08130289B2 System, method, and apparatus for correction of dark current error in semiconductor imaging devices
有权
用于校正半导体成像装置中的暗电流误差的系统,方法和装置
- 专利标题: System, method, and apparatus for correction of dark current error in semiconductor imaging devices
- 专利标题(中): 用于校正半导体成像装置中的暗电流误差的系统,方法和装置
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申请号: US12237625申请日: 2008-09-25
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公开(公告)号: US08130289B2公开(公告)日: 2012-03-06
- 发明人: Nick Tu , Nikolai E. Bock
- 申请人: Nick Tu , Nikolai E. Bock
- 申请人地址: KY George Town
- 专利权人: Aptima Imaging Corporation
- 当前专利权人: Aptima Imaging Corporation
- 当前专利权人地址: KY George Town
- 代理商 Nancy Y. Ru
- 主分类号: H04N5/217
- IPC分类号: H04N5/217 ; H04N9/64 ; H04N3/14 ; H04N5/335
摘要:
Detection cells configured to output signals for dark current error correction. Various embodiments of detection cells accumulate dark charge supplied by dark current sources, and output dark charge signals indicating the amount of accumulated dark charge. The dark charge signals may be used to approximate the amount of dark charge read out by pixel cells of an imaging array and/or to offset portions of pixel cell signals attributable to dark charge accumulation.
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