发明授权
- 专利标题: Mass spectrometer
- 专利标题(中): 质谱仪
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申请号: US12526163申请日: 2008-02-19
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公开(公告)号: US08134120B2公开(公告)日: 2012-03-13
- 发明人: Joerg Mueller , Eric Wapelhorst , Jan-Peter Hauschild
- 申请人: Joerg Mueller , Eric Wapelhorst , Jan-Peter Hauschild
- 申请人地址: DE Leverkusen
- 专利权人: Bayer Technology Services GmbH
- 当前专利权人: Bayer Technology Services GmbH
- 当前专利权人地址: DE Leverkusen
- 代理机构: Norris McLaughlin & Marcus, PA
- 代理商 Christa Hildebrand, Esq.
- 优先权: EP07003392 20070219
- 国际申请: PCT/EP2008/001287 WO 20080219
- 国际公布: WO2008/101669 WO 20080828
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
A mass spectrometer with an ionization chamber with a feed channel for a gas to be examined, including an electron source (d, n) for ionizing the gas to be examined, electrodes (c) for accelerating the ionizing electrons, electrodes (g, h, j, m) for the mass-dependent separation of the ions by acceleration/deceleration thereof, a detector (l) for the separated ions, a wiring with metallic conductors. The components are arranged on a plane nonconductive substrate (1), having an energy filter (k) for the ions, the energy filter being embodied as a 90° sector, is constructed in completely planar fashion. The ionization chamber (b), the electrodes (g, h, j, m) for accelerating the electrons and ions, the detector (l) for the ions and the energy filter (k) are produced by a single step of photolithography and etching of a doped semiconductor die (6) applied to the substrate (1) and the wiring (2) and the abovementioned parts are covered by a second flat nonconductive substrate (7).
公开/授权文献
- US20100090103A1 MASS SPECTROMETER 公开/授权日:2010-04-15
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