发明授权
- 专利标题: Low temperature degradation resistant yttria stabilized zirconia
- 专利标题(中): 耐低温降解氧化钇稳定氧化锆
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申请号: US12390782申请日: 2009-02-23
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公开(公告)号: US08140162B1公开(公告)日: 2012-03-20
- 发明人: Guangqiang Jiang , Kate E. Purnell , Gary D. Schnittgrund
- 申请人: Guangqiang Jiang , Kate E. Purnell , Gary D. Schnittgrund
- 申请人地址: US CA Santa Clarita
- 专利权人: Alfred E. Mann Foundation For Scientific Research
- 当前专利权人: Alfred E. Mann Foundation For Scientific Research
- 当前专利权人地址: US CA Santa Clarita
- 代理商 Gary D. Schnittgrund
- 主分类号: A61N1/375
- IPC分类号: A61N1/375
摘要:
The invention is directed to an apparatus substantially eliminating destructive low-temperature, humidity-enhanced phase transformation of yttria-stabilized zirconia in general, as well as eliminating low-temperature degradation of yttria-stabilized tetragonal zirconia polycrystalline ceramic (Y-TZP). The martensitic-type phase transformation from tetragonal to monoclinic is accompanied by severe strength degradation in a moist environment at low-temperature, specifically at room temperature as well as at body temperature. This class of materials has been chosen as the packaging material for small implantable neural-muscular sensors and stimulators because of the high fracture toughness and high mechanical strength. This destructive phase transformation has been substantially eliminated, thus ensuring the safety of long-term implants, by subjecting the sintered components to post-machining hot isostatic pressing, such that the average grain size is less than about 0.5 microns.
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