Invention Grant
- Patent Title: Wire length measurement device
- Patent Title (中): 线长测量装置
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Application No.: US12954658Application Date: 2010-11-25
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Publication No.: US08141266B2Publication Date: 2012-03-27
- Inventor: Zheng-Heng Sun
- Applicant: Zheng-Heng Sun
- Applicant Address: TW Tu-Cheng, New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN201010169046 20100511
- Main IPC: G01B3/04
- IPC: G01B3/04

Abstract:
A length measurement device comprises a first connector, a measurement wire, and a second connector. The second connector comprises a substrate and a fixer pivotally connected to the substrate. The measurement wire is an electrical wire with a scale. One end of the measurement wire is connected to the first connector, and another end is movably connected to the substrate of the second connector and the fixer.
Public/Granted literature
- US20110277332A1 WIRE LENGTH MEASUREMENT DEVICE Public/Granted day:2011-11-17
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