发明授权
- 专利标题： Systems and methods for self testing a voltage controlled oscillator in an open loop configuration
- 专利标题（中）： 用于在开环配置中自我测试压控振荡器的系统和方法
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申请号： US12469548申请日： 2009-05-20
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公开(公告)号： US08143958B2公开(公告)日： 2012-03-27
- 发明人: Jeongsik Yang , Jin Wook Kim , Hong Sun Kim , Sang-Oh Lee
- 申请人： Jeongsik Yang , Jin Wook Kim , Hong Sun Kim , Sang-Oh Lee
- 申请人地址： US CA San Diego
- 专利权人： QUALCOMM, Incorporated
- 当前专利权人： QUALCOMM, Incorporated
- 当前专利权人地址： US CA San Diego
- 代理商 William M. Hooks
- 主分类号： H03L7/099
- IPC分类号： H03L7/099 ; G01R23/00
摘要：
Methods and apparatus for self testing a multiband voltage controlled oscillator (VCO) are disclosed. A tuning voltage of the VCO is adjusted where the output of the VCO does not affect the input to the VCO. Frequency bands in the VCO are selected. Output frequencies of the VCO are measured.
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