发明授权
- 专利标题: Semiconductor device
- 专利标题(中): 半导体器件
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申请号: US13099720申请日: 2011-05-03
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公开(公告)号: US08144518B2公开(公告)日: 2012-03-27
- 发明人: Masamichi Fujito , Makoto Mizuno , Takahiro Yokoyama , Kenji Kawada , Takashi Iwase , Yasunobu Aoki , Takashi Kurafuji , Tomohiro Uchiyama , Shuichi Sato , Yuji Uji
- 申请人: Masamichi Fujito , Makoto Mizuno , Takahiro Yokoyama , Kenji Kawada , Takashi Iwase , Yasunobu Aoki , Takashi Kurafuji , Tomohiro Uchiyama , Shuichi Sato , Yuji Uji
- 申请人地址: JP Kanagawa
- 专利权人: Renesas Electronics Corporation
- 当前专利权人: Renesas Electronics Corporation
- 当前专利权人地址: JP Kanagawa
- 代理机构: Mattingly & Malur, PC
- 优先权: JP2006-277110 20061011; JP2007-233738 20070910
- 主分类号: G11C16/00
- IPC分类号: G11C16/00
摘要:
The semiconductor device includes a nonvolatile memory, having a memory array containing 1-bit twin cells, each composed of electrically rewritable first and second storage devices, the first and second storage devices holding binary data according to difference of their threshold voltages, and having different retention characteristics depending on difference of the binary data thereof; a read circuit for differentially amplifying complementary data output from the first and second storage devices of the twin cell selected for read, and judging information stored in the twin cell; and a control circuit. Two memory cells constituting a twin cell are arranged to hold different data. Therefore, even when the retention performance of one memory cell deteriorates, the difference between data held by the two memory cells can be maintained. Hence, differential amplification of such difference enables acquisition of proper stored information. Thus, retention performance of an electrically rewritable nonvolatile memory cell is improved.
公开/授权文献
- US20110208904A1 SEMICONDUCTOR DEVICE 公开/授权日:2011-08-25