Invention Grant
- Patent Title: Method for separating semiconductor layer from substrate
- Patent Title (中): 从衬底分离半导体层的方法
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Application No.: US12437058Application Date: 2009-05-07
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Publication No.: US08148246B2Publication Date: 2012-04-03
- Inventor: Wen Yu Lin , Shih Cheng Huang , Po Min Tu , Chih Peng Hsu , Shih Hsiung Chan
- Applicant: Wen Yu Lin , Shih Cheng Huang , Po Min Tu , Chih Peng Hsu , Shih Hsiung Chan
- Applicant Address: TW Hsinchu Hsien
- Assignee: Advanced Optoelectronic Technology, Inc.
- Current Assignee: Advanced Optoelectronic Technology, Inc.
- Current Assignee Address: TW Hsinchu Hsien
- Agency: Altis Law Group, Inc.
- Priority: TW97117099A 20080509
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
A method for separating a semiconductor from a substrate is disclosed. The method comprises the following steps: forming a plurality of columns on a substrate; epitaxially growing a semiconductor on the plurality of columns; and injecting etching liquid into the void among the plurality of columns so as to separate the semiconductor from the substrate. The method of this invention can enhance the etching efficiency of separating the semiconductor from the substrate and reduce the fabrication cost because the etching area is increased due to the void among the plurality of columns. In addition, the method will not confine the material of the above-mentioned substrate.
Public/Granted literature
- US20090280625A1 METHOD FOR SEPARATING SEMICONDUCTOR LAYER FROM SUBSTRATE Public/Granted day:2009-11-12
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