发明授权
- 专利标题： Instrumentation structure with reduced electromagnetic radiation reflectivity or interference characteristics
- 专利标题（中）： 具有降低电磁辐射反射率或干扰特性的仪器结构
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申请号： US12172216申请日： 2008-07-12
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公开(公告)号： US08149153B1公开(公告)日： 2012-04-03
- 发明人: Garry Wieneke , Ameer Beitvashahi , Dent Matthew , Gerry Miller
- 申请人： Garry Wieneke , Ameer Beitvashahi , Dent Matthew , Gerry Miller
- 申请人地址： US DC Washington
- 专利权人： The United States of America as represented by the Secretary of the Navy
- 当前专利权人： The United States of America as represented by the Secretary of the Navy
- 当前专利权人地址： US DC Washington
- 代理商 Christopher A. Monsey
- 主分类号： H01Q17/00
- IPC分类号： H01Q17/00
摘要：
An instrumentation structure includes a sensor array and a support structure. The sensor array is rotatable around multiple axes. Radar absorbent material (RAM) is adapted to conform to non-planar exterior surfaces of the instrumentation structure.
公开/授权文献
- US1300830A Shade-holding device. 公开/授权日：1919-04-15
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