Invention Grant
US08149992B2 X-ray tube target, X-ray tube using the same, X-ray inspection device and method of producing X-ray tube target
有权
X射线管靶，使用X射线管的X射线管，X射线检查装置及X射线管靶的制作方法
- Patent Title: X-ray tube target, X-ray tube using the same, X-ray inspection device and method of producing X-ray tube target
- Patent Title (中): X射线管靶，使用X射线管的X射线管，X射线检查装置及X射线管靶的制作方法
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Application No.: US12985631Application Date: 2011-01-06
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Publication No.: US08149992B2Publication Date: 2012-04-03
- Inventor: Akihisa Nitta , Shinichi Yamamoto , Hiromichi Horie
- Applicant: Akihisa Nitta , Shinichi Yamamoto , Hiromichi Horie
- Applicant Address: JP JP
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Materials Co., Ltd.
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Materials Co., Ltd.
- Current Assignee Address: JP JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2008-179011 20080709
- Main IPC: H01J35/10
- IPC: H01J35/10
Abstract:
According to one embodiment, there is provided an X-ray tube target. The X-ray tube target has a structure in which a carbon base material is bonded with an Mo base material or Mo alloy base material with a joint layer. The joint layer includes an MoNbTi diffusion phase, an NbTi alloy phase, an Nb-rich phase and a ZrNb alloy phase when the ratios of components in the joint layer are detected by EPMA.
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