- 专利标题: Method of fabricating semiconductor device
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申请号: US12883526申请日: 2010-09-16
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公开(公告)号: US08154136B2公开(公告)日: 2012-04-10
- 发明人: Hongyong Zhang
- 申请人: Hongyong Zhang
- 申请人地址: JP Atsugi-shi, Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Atsugi-shi, Kanagawa-ken
- 代理机构: Fish & Richardson P.C.
- 优先权: JP7-332629 19951127
- 主分类号: H01L23/48
- IPC分类号: H01L23/48
摘要:
Method of fabricating thin-film transistors in which contact with connecting electrodes becomes reliable. When contact holes are formed, the bottom insulating layer is subjected to a wet etching process, thus producing undercuttings inside the contact holes. In order to remove the undercuttings, a light etching process is carried out to widen the contact holes. Thus, tapering section are obtained, and the covering of connection wiring is improved.
公开/授权文献
- US08283788B2 Method of fabricating semiconductor device 公开/授权日:2012-10-09
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