发明授权
US08158938B2 Scanning electron microscope and a method for imaging a specimen using the same 有权
扫描电子显微镜和使用其的成像成像方法

Scanning electron microscope and a method for imaging a specimen using the same
摘要:
(1) part or all of the number, coordinates and size/shape and imaging sequence of imaging points each for observation, the imaging position change method and imaging conditions can be calculated automatically from CAD data, (2) a combination of input information and output information for imaging recipe creation can be set arbitrarily, and (3) decision is made of imaging or processing at an arbitrary imaging point as to whether to be successful/unsuccessful and in case a failure is determined, a relief process can be conducted in which the imaging point or imaging sequence is changed.
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