Invention Grant
- Patent Title: Dual-energy imaging at reduced sample rates
- Patent Title (中): 降低采样率的双能量成像
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Application No.: US12962972Application Date: 2010-12-08
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Publication No.: US08160206B2Publication Date: 2012-04-17
- Inventor: Xiaoye Wu , David Allen Langan , Jiang Hsieh , Robert Franklin Senzig , Hao Lai , Dan Xu , Thomas Matthew Benson
- Applicant: Xiaoye Wu , David Allen Langan , Jiang Hsieh , Robert Franklin Senzig , Hao Lai , Dan Xu , Thomas Matthew Benson
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, PC
- Main IPC: H05G1/64
- IPC: H05G1/64
Abstract:
The present disclosure relates to the generation of dual-energy X-ray data using a data sampling rate comparable to the rate utilized for single-energy imaging. In accordance with the present technique a reduced kVp switching rate is employed compared to conventional dual-energy imaging. Full angular resolution is achieved in the generated images.
Public/Granted literature
- US20110150183A1 DUAL-ENERGY IMAGING AT REDUCED SAMPLE RATES Public/Granted day:2011-06-23
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