发明授权
- 专利标题: Highly specialized scenarios in random test generation
- 专利标题(中): 随机测试生成中的高度专业化场景
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申请号: US12139476申请日: 2008-06-15
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公开(公告)号: US08161440B2公开(公告)日: 2012-04-17
- 发明人: Roy Emek , Itai Jaeger , Tzach Schechner
- 申请人: Roy Emek , Itai Jaeger , Tzach Schechner
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
A computer software product is provided. The product includes a computer-readable medium in which computer program instructions are stored, which instructions, when read by a computer, cause the computer to perform a method for functional verification of a design, having an operational space comprising the steps of accepting as an input a test template that specifies test parameters directed to a function of the design, the template comprising constraints and variables covering a working space within the operational space, associating an exemption mode of operation with at least one of the constraints or at least one of the variables, wherein a domain of the at least one of the variables is modified or the at least one of the constraints is disabled in the exemption mode of operation, producing a test case that lies in the operational space of the design by enabling the exemption mode of operation, the test case comprising a series of transactions originating from the template, wherein the transactions exercise the function of the design, wherein the working space is modified in the exemption mode of operation and submitting the test case for execution by the design, wherein the exemption mode of operation is associated with only a portion of the template.
公开/授权文献
- US20090313590A1 HIGHLY SPECIALIZED SCENARIOS IN RANDOM TEST GENERATION 公开/授权日:2009-12-17
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