发明授权
- 专利标题: XML/database/XML layer analysis
- 专利标题(中): XML /数据库/ XML层分析
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申请号: US12179945申请日: 2008-07-25
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公开(公告)号: US08165999B2公开(公告)日: 2012-04-24
- 发明人: Mohan K. Jadhav , Debarshi Raha
- 申请人: Mohan K. Jadhav , Debarshi Raha
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Sughrue Mion, PLLC.
- 主分类号: G06F7/00
- IPC分类号: G06F7/00 ; G06F17/00
摘要:
An automated method for testing XML/Database/XML layers. To the extent that XML is the de facto communication standard for today's middleware products, most of the middleware products need to produce/accept XML data at some interfaces. This data either comes from or needs to be persisted into DB (database). Two end points are thus represented by XML input/output and DB. To ensure the accuracy of data at the two end points, the same data are typically converted from one format to another between the end points. Manual verification in this vein is possible for development purposes, but in practice this presents inefficiencies if done repeatedly. Accordingly, there is broadly contemplated herein an automation technique to verify the accuracy of data at the two end points.
公开/授权文献
- US20100023539A1 XML/DATABASE/XML LAYER ANALYSIS 公开/授权日:2010-01-28
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