Invention Grant
- Patent Title: Chip testing circuit
- Patent Title (中): 芯片测试电路
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Application No.: US12877510Application Date: 2010-09-08
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Publication No.: US08169228B2Publication Date: 2012-05-01
- Inventor: Der-Min Yuan , Yi-Hao Chang , Peng-Yu Chen
- Applicant: Der-Min Yuan , Yi-Hao Chang , Peng-Yu Chen
- Applicant Address: TW Hsin Chu
- Assignee: Etron Technology, Inc.
- Current Assignee: Etron Technology, Inc.
- Current Assignee Address: TW Hsin Chu
- Agency: Muncy, Geissler, Olds & Lowe, PLLC
- Priority: TW98145712A 20091230
- Main IPC: G01R31/3187
- IPC: G01R31/3187
Abstract:
A chip testing circuit is disclosed. The chip testing circuit uses a judging circuit to switch the connection of the data compressing circuit between data compressing base units which compresses 4 XIOs, so as to obtain testing data by one single interface circuit and to increase the testing throughput.
Public/Granted literature
- US20110156742A1 Chip Testing Circuit Public/Granted day:2011-06-30
Information query
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