Invention Grant
- Patent Title: Method for selecting statistically validated candidate genes
- Patent Title (中): 选择统计学验证的候选基因的方法
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Application No.: US12367045Application Date: 2009-02-06
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Publication No.: US08170805B2Publication Date: 2012-05-01
- Inventor: Venkata Krishna Kishore , Zhigang Guo , Min Li , Daolong Wang , Libardo Andres Gutierrez Rojas , Joseph Dallas Clarke, V , Joseph Byrum
- Applicant: Venkata Krishna Kishore , Zhigang Guo , Min Li , Daolong Wang , Libardo Andres Gutierrez Rojas , Joseph Dallas Clarke, V , Joseph Byrum
- Applicant Address: CH Basel
- Assignee: Syngenta Participations AG
- Current Assignee: Syngenta Participations AG
- Current Assignee Address: CH Basel
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; G01N33/48 ; G06G7/58

Abstract:
Provided herein are methods for evaluating associations between candidate genes and a trait of interest in a population. The methods include a combination of genome-wide association analysis and one or more of nested association mapping (NAM), expression QTL analysis (eQTL), and allele epistastic analysis (AEA). Markers are selected or prioritized if they are shown to be positively-correlated with a trait of interest using GWA and a combination of one or both of NAM and eQTL. Also provided are models for evaluating the association between a candidate marker and a trait in a nested population of organisms. These methods include single marker regression and multiple marker regression models. Markers identified using the methods of the invention can be used in marker assisted breeding and selection, as genetic markers for constructing linkage maps, for gene discovery, for identifying genes contributing to a trait of interest, and for generating transgenic organisms having a desired trait.
Public/Granted literature
- US20100204921A1 METHOD FOR SELECTING STATISTICALLY VALIDATED CANDIDATE GENES Public/Granted day:2010-08-12
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