发明授权
- 专利标题: High spatial resolution imaging of a structure of interest in a specimen
- 专利标题(中): 样本中感兴趣结构的高空间分辨率成像
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申请号: US12949159申请日: 2010-11-18
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公开(公告)号: US08174692B2公开(公告)日: 2012-05-08
- 发明人: Stefan W. Hell , Jonas Fölling , Christian Eggeling , Alexander Egner , Andreas Schönle , Mariano Bossi
- 申请人: Stefan W. Hell , Jonas Fölling , Christian Eggeling , Alexander Egner , Andreas Schönle , Mariano Bossi
- 申请人地址: DE Munich
- 专利权人: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- 当前专利权人: Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- 当前专利权人地址: DE Munich
- 代理机构: Thomas, Kayden, Horstemeyer & Risley, LLP
- 优先权: DE102008024568 20080521; EP08164352 20080915
- 主分类号: G01J3/30
- IPC分类号: G01J3/30
摘要:
In high spatial resolution imaging, a structure in a specimen is marked with a substance which, in a first electronic state, is excited by light of one wavelength to emit fluorescent light, which is also converted from its first into a second electronic state by that light, and which returns from its second into its first electronic state. The specimen is imaged onto a sensor at a spatial resolution not resolving an average spacing between neighboring molecules of the substance, and exposed to the light at such an intensity that the molecules in the first state are alternately excited to emit fluorescent light and converted into their second state, and that at least 10% of the molecules presently in their first state lie at a distance from their closest neighboring molecules in their first state which is greater than the spatial resolution of the imaging onto the sensor.
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