发明授权
US08176400B2 Systems and methods for enhanced flaw scan in a data processing device
有权
用于在数据处理设备中增强缺陷扫描的系统和方法
- 专利标题: Systems and methods for enhanced flaw scan in a data processing device
- 专利标题(中): 用于在数据处理设备中增强缺陷扫描的系统和方法
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申请号: US12556180申请日: 2009-09-09
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公开(公告)号: US08176400B2公开(公告)日: 2012-05-08
- 发明人: Weijun Tan , Shaohua Yang , Hongwei Song , Richard Rauschmayer
- 申请人: Weijun Tan , Shaohua Yang , Hongwei Song , Richard Rauschmayer
- 申请人地址: US CA Milpitas
- 专利权人: LSI Corporation
- 当前专利权人: LSI Corporation
- 当前专利权人地址: US CA Milpitas
- 代理机构: Hamilton, DeSanctis & Cha
- 主分类号: H03M13/00
- IPC分类号: H03M13/00
摘要:
Various embodiments of the present invention provide systems and methods for flaw scan in a data processing system. As one example, a data processing system is disclosed that includes a data detector circuit, a bit sign inverting circuit, and an LDPC decoder circuit. The data detector circuit receives a verification data set that is an invalid LDPC codeword, and applies a data detection algorithm to the verification data set to yield a detected output. The bit sign inverting circuit modifies the sign of one or more elements of a first derivative of the detected output to yield a second derivative of the detected output. The second derivative of the detected output is an expected valid LDPC codeword. The LDPC decoder circuit applies a decoding algorithm to the second derivative of the detected output to yield a decoded output.
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