发明授权
US08183124B2 Silicon carbide and related wide-bandgap transistors on semi insulating epitaxy 失效
碳化硅和半绝缘外延上的相关宽带隙晶体管

  • 专利标题: Silicon carbide and related wide-bandgap transistors on semi insulating epitaxy
  • 专利标题(中): 碳化硅和半绝缘外延上的相关宽带隙晶体管
  • 申请号: US12881771
    申请日: 2010-09-14
  • 公开(公告)号: US08183124B2
    公开(公告)日: 2012-05-22
  • 发明人: Michael S. Mazzola
  • 申请人: Michael S. Mazzola
  • 申请人地址: US MS Jackson
  • 专利权人: SS SC IP, LLC
  • 当前专利权人: SS SC IP, LLC
  • 当前专利权人地址: US MS Jackson
  • 代理机构: Morris, Manning & Martin, LLP
  • 代理商 Christopher W. Raimund
  • 主分类号: H01L21/76
  • IPC分类号: H01L21/76
Silicon carbide and related wide-bandgap transistors on semi insulating epitaxy
摘要:
A method of making a semi-insulating epitaxial layer includes implanting a substrate or a first epitaxial layer formed on the substrate with boron ions to form a boron implanted region on a surface of the substrate or on a surface of the first epitaxial layer, and growing a second epitaxial layer on the boron implanted region of the substrate or on the boron implanted region of the first epitaxial layer to form a semi-insulating epitaxial layer.
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