Invention Grant
US08188441B2 Ultraviolet intensity detecting method, fabricating display apparatus method and display apparatus using the same
有权
紫外线强度检测方法,制造显示装置方法和使用该方法的显示装置
- Patent Title: Ultraviolet intensity detecting method, fabricating display apparatus method and display apparatus using the same
- Patent Title (中): 紫外线强度检测方法,制造显示装置方法和使用该方法的显示装置
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Application No.: US12395717Application Date: 2009-03-02
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Publication No.: US08188441B2Publication Date: 2012-05-29
- Inventor: Chi-Hua Sheng , Ruei-Liang Luo , Chun-Huai Li
- Applicant: Chi-Hua Sheng , Ruei-Liang Luo , Chun-Huai Li
- Applicant Address: TW Hsinchu
- Assignee: Au Optronics Corporation
- Current Assignee: Au Optronics Corporation
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW97120279A 20080530
- Main IPC: G01J3/02
- IPC: G01J3/02

Abstract:
A display apparatus is provided. The display apparatus is used for detecting an ultraviolet (UV) intensity. The display apparatus includes a lower-substrate, an upper-substrate and a processing unit. The lower-substrate includes a first, a second and a third photo sensors for detecting an intensity of the light in a first, a second and a third bands and converting the intensity of the light in the first, the second and the third bands into a first, a second and a third currents respectively, wherein the ranges of the second and the third bands are comprised within the range of the first band. The upper-substrate is disposed opposite to the lower-substrate. The processing unit is coupled to the first, the second and the third photo sensors, for receiving and processing the first, the second and the third currents so as to obtain the UV intensity.
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