发明授权
US08188441B2 Ultraviolet intensity detecting method, fabricating display apparatus method and display apparatus using the same
有权
紫外线强度检测方法,制造显示装置方法和使用该方法的显示装置
- 专利标题: Ultraviolet intensity detecting method, fabricating display apparatus method and display apparatus using the same
- 专利标题(中): 紫外线强度检测方法,制造显示装置方法和使用该方法的显示装置
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申请号: US12395717申请日: 2009-03-02
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公开(公告)号: US08188441B2公开(公告)日: 2012-05-29
- 发明人: Chi-Hua Sheng , Ruei-Liang Luo , Chun-Huai Li
- 申请人: Chi-Hua Sheng , Ruei-Liang Luo , Chun-Huai Li
- 申请人地址: TW Hsinchu
- 专利权人: Au Optronics Corporation
- 当前专利权人: Au Optronics Corporation
- 当前专利权人地址: TW Hsinchu
- 代理机构: Jianq Chyun IP Office
- 优先权: TW97120279A 20080530
- 主分类号: G01J3/02
- IPC分类号: G01J3/02
摘要:
A display apparatus is provided. The display apparatus is used for detecting an ultraviolet (UV) intensity. The display apparatus includes a lower-substrate, an upper-substrate and a processing unit. The lower-substrate includes a first, a second and a third photo sensors for detecting an intensity of the light in a first, a second and a third bands and converting the intensity of the light in the first, the second and the third bands into a first, a second and a third currents respectively, wherein the ranges of the second and the third bands are comprised within the range of the first band. The upper-substrate is disposed opposite to the lower-substrate. The processing unit is coupled to the first, the second and the third photo sensors, for receiving and processing the first, the second and the third currents so as to obtain the UV intensity.
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