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US08188454B2 Forming a phase change memory with an ovonic threshold switch 有权
形成一个带有超声门限开关的相变存储器

Forming a phase change memory with an ovonic threshold switch
Abstract:
A phase change memory may include an ovonic threshold switch formed over an ovonic memory. In one embodiment, the switch includes a chalcogenide layer that overlaps an underlying electrode. Then, edge damage, due to etching the chalcogenide layer, may be isolated to reduce leakage current.
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