Invention Grant
US08188755B2 Electrostatic MEMS driver with on-chip capacitance measurement for autofocus applications
有权
用于自动对焦应用的具有片上电容测量的静电MEMS驱动器
- Patent Title: Electrostatic MEMS driver with on-chip capacitance measurement for autofocus applications
- Patent Title (中): 用于自动对焦应用的具有片上电容测量的静电MEMS驱动器
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Application No.: US12685992Application Date: 2010-01-12
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Publication No.: US08188755B2Publication Date: 2012-05-29
- Inventor: Roberto Alini , Roberto Casiraghi
- Applicant: Roberto Alini , Roberto Casiraghi
- Applicant Address: US CA Sunnyvale
- Assignee: Maxim Integrated Products, Inc.
- Current Assignee: Maxim Integrated Products, Inc.
- Current Assignee Address: US CA Sunnyvale
- Main IPC: G01R27/26
- IPC: G01R27/26
Abstract:
A driver and capacitance measuring circuit includes a voltage source that selectively generates an output voltage at a first node during a driver mode to alter a capacitance of a device that is connected to the first node and that has a variable capacitance. A current source selectively provides one of a charging and discharging current at the first node during a measurement mode. A capacitance calculating circuit samples a voltage at the first node during the measurement node, determines a voltage change rate of the first node during the measurement mode and calculates the capacitance of the device based on the voltage change rate and a value of the one of the charging and discharging current.
Public/Granted literature
- US20110169509A1 ELECTROSTATIC MEMS DRIVER WITH ON-CHIP CAPACITANCE MEASUREMENT FOR AUTOFOCUS APPLICATIONS Public/Granted day:2011-07-14
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