发明授权
- 专利标题: Device and method for inspecting equipment
- 专利标题(中): 检查设备的装置和方法
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申请号: US12533301申请日: 2009-07-31
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公开(公告)号: US08188864B2公开(公告)日: 2012-05-29
- 发明人: Yong Hoon Choi , Hoon Jung , Jong Heung Park
- 申请人: Yong Hoon Choi , Hoon Jung , Jong Heung Park
- 申请人地址: KR Daejeon
- 专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人地址: KR Daejeon
- 代理机构: Staas & Halsey LLP
- 优先权: KR10-2008-0075463 20080801
- 主分类号: G08B13/14
- IPC分类号: G08B13/14
摘要:
An equipment inspecting device for inspecting at least one piece of equipment positioned in an office from among a plurality of offices included in the equipment inspection target recognizes office information for indicating a position of an office, and searches office equipment information for indicating a previous state of at least one piece of equipment positioned in the office by using the office information. The equipment inspecting device transmits the searched office equipment information to the equipment information collecting device so that an equipment information collecting device for collecting at least one piece of equipment information corresponding to at least one piece of equipment may generate update information for indicating a state change of at least one piece of equipment. Also, the equipment inspecting device receives the update information from the equipment information collecting device, and updates office equipment information by using the update information.
公开/授权文献
- US20100026497A1 DEVICE AND METHOD FOR INSPECTING EQUIPMENT 公开/授权日:2010-02-04
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