发明授权
- 专利标题: Semiconductor device package with an alignment mark
- 专利标题(中): 具有对准标记的半导体器件封装
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申请号: US12683421申请日: 2010-01-06
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公开(公告)号: US08193647B2公开(公告)日: 2012-06-05
- 发明人: Chuehan Hsieh , Hung-Jen Yang , Min-Lung Huang
- 申请人: Chuehan Hsieh , Hung-Jen Yang , Min-Lung Huang
- 申请人地址: TW Kaosiung
- 专利权人: Advanced Semiconductor Engineering, Inc.
- 当前专利权人: Advanced Semiconductor Engineering, Inc.
- 当前专利权人地址: TW Kaosiung
- 代理机构: Foley & Lardner LLP
- 优先权: TW98124625A 20090721
- 主分类号: H01L23/544
- IPC分类号: H01L23/544 ; H01L21/76
摘要:
A semiconductor device package includes a semiconductor device, a sealant, a first dielectric layer, an electrically conductive layer, and a second dielectric layer. The semiconductor device includes a contact pad, an active surface, and side surfaces, where the contact pad is disposed adjacent to the active surface. The semiconductor device is formed with a first alignment mark that is disposed adjacent to the active surface. The sealant envelopes the side surfaces of the semiconductor device and exposes the contact pad. The first dielectric layer is disposed adjacent to the sealant and the active surface, and defines a first aperture that exposes the contact pad. The electrically conductive layer is disposed adjacent to the first dielectric layer and is electrically connected to the contact pad through the first aperture. The second dielectric layer is disposed adjacent to the electrically conductive layer.
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